DDR3 Data Eye Diagram Test
Significantly reduce the time required for analyzing signal integrity conditions!
Compliance testing is essential to ensure that the timing, slew rate, and voltage levels of Dynamic Random Access Memory (DRAM) signals conform to specifications. By utilizing eye diagram testing, the time required for analyzing signal integrity conditions can be significantly reduced, allowing for quick inspection of signal quality. The following challenges are addressed by the "DDR3 Data Eye Diagram Test": [Challenges] ■ Lack of flexibility to quickly debug signal integrity issues ■ Need for separation of read/write operations ■ Overlapping of consecutive bits within a data burst for testing based on a simple mask *For more details, please refer to the PDF document or feel free to contact us.
- 企業：ローデ・シュワルツ・ジャパン
- 価格：Other
